Keynote Speaker: Phil Nigh

Phil Nigh is a Distinguished Member of Technical Staff and has been a Test Engineer for over 33 years at IBM and GLOBALFOUNDRIES. He is responsible for defining & driving Test Strategy including test methods, design-for-test, diagnostic methods and Adaptive Testing. He has over 40 world-wide patents. Phil received his PhD from Carnegie Mellon University in 1990. Phil received the Best Paper award at the International Test Conference in 1999 and has done a number of keynote presentations at conferences and workshops. He has organized the “Industry Test Challenges” workshop for over 15 years.

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