The SW Test Committee is an international group of experienced probe technologists that volunteer their time and efforts to help develop the Technical Program of the workshop. All committee members are asked to help guide the program as well as "beat the bushes" to encourage colleagues, customers, and suppliers to submit their work for an interesting and topical agenda. Committee members may be asked to help select the presentations, invite additional speakers and presenters, provide tutorials, and coordinate the technical sessions during the workshop. Participation on the SW Test Committee is a purely voluntary activity and should be considered a personal commitment to the workshop and associated activities. Any one interested in becoming a member of the committee and contributing to the success of the SW Test Workshop should contact the General Chair.
Steering Committee Members for SW Test 2012:
Dr. Jerry Broz, Ph.D., International Test Solutions, General Chair
Rey Rincon, Freescale Semiconductor,
Technical Program Chair
Maddie Harwood, CEM America, Finance Chair
Jan Martens, NXP Semiconductor,
Program Committee
Darren James, Rudolph Technologies,
Program Committee
Patrick Mui, JEM America,
Program Committee
Fred Taber, BiTS Workshop,
Proceedings Coordinator
Roy Swart, Intel, Steering
Committee
Gunther Boehm, FeinMetall GmbH
John Caldwell, Micron Technology
Boyd Daniels, Texas Instruments
Michael Huebner, Ph.D., FormFactor
Tatsuo Inoue, Micronics Japan (MJC)
Amy Leong, Microprobe
Mark Ojeda, Spansion
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