The SW Test Committee is an international group of experienced probe technologists that volunteer their time and efforts to help develop the Technical Program of the conference. All committee members are asked to help guide the program as well as “beat the bushes” to encourage colleagues, customers, and suppliers to submit their work for an interesting and topical agenda. Committee members may be asked to help select the presentations, invite additional speakers and presenters, provide tutorials, and coordinate the technical sessions during the workshop. Participation on the SW Test Committee is a purely voluntary activity and should be considered a personal commitment to the workshop and associated activities. Anyone interested in becoming a member of the committee and contributing to the success of the SW Test should contact the General Chair.
SW Test Chairs
Dr. Jerry Broz, Ph.D., MJC Electronics, Corp., General Chair
Rey Rincon, NXP Semiconductor, Technical Program Chair
Maddie Harwood, CEM Inc., Finance Chair
Technical Program Committee
John Caldwell, Micron Technology, Program Committee
Patrick Mui, JEM America, Program Committee
Darren James, Rudolph Technologies, Program Committee
Karen Armendariz, Celadon Systems
Gunther Boehm, FeinMetall GmbH (Germany)
Geert Gouwy, Melexis Semiconductor (Belgium)
Michael Huebner, Ph.D., FormFactor
Amy Leong, FormFactor, Inc.
Clark Liu, Powertech Technology, Inc. (Taiwan)
Mark Ojeda, Cypress Semiconductor
Suz Ramsbottom, Texas Instruments, Inc.
Raffaele Vallauri, Technoprobe (Italy)
Joey Wu, STAr Technologies (Taiwan)
Alex Yang, MPI Corporation (Taiwan)
Sang Kyu (SK) Yoo, Samsung Electronics (Korea)