The SW Test Committee is an international group of experienced probe technologists that volunteer their time and efforts to help develop the Technical Program of the workshop. All committee members are asked to help guide the program as well as “beat the bushes” to encourage colleagues, customers, and suppliers to submit their work for an interesting and topical agenda. Committee members may be asked to help select the presentations, invite additional speakers and presenters, provide tutorials, and coordinate the technical sessions during the workshop. Participation on the SW Test Committee is a purely voluntary activity and should be considered a personal commitment to the workshop and associated activities. Anyone interested in becoming a member of the committee and contributing to the success of the SW Test Workshop should contact the General Chair.
Steering Committee Members for SW Test 2017:
Dr. Jerry Broz, Ph.D., MJC Electronics, Corp., General Chair
Rey Rincon, NXP Semiconductor, Technical Program Chair
Maddie Harwood, CEM Inc., Finance Chair
John Caldwell, Micron Technology, Program Committee
Patrick Mui, JEM America, Program Committee
Fred Taber, Consultant
Karen Armendariz, Celadon Systems
Gunther Boehm, FeinMetall GmbH
Michael Huebner, Ph.D., FormFactor
Amy Leong, FormFactor, Inc.
Clark Liu, Powertech Technology, Inc. (PTI – Taiwan)
Gary Maier, IBM Corporation
Mark Ojeda, Cypress Semiconductor
Joey Wu, MPI Corporation (Taiwan)
Al Wegleitner, Texas Instruments, Inc.
Sang Kyu (SK) Yoo, Samsung Electronics – Korea
Stevan Hunter, Ph.D., ON Semiconductor, Committee Emeritus
Darren James, Rudolph Technologies, Committee Emeritus