The annual SW Test Workshop is the only IEEE-sponsored conference that focuses on all aspects of semiconductor wafer and die level probe testing. The workshop begins Sunday afternoon, June
12, with a tutorial and three presentations, followed by a welcome reception, dinner, and a Keynote Speaker. The Technical Program begins Monday morning with 30-minute presentations in theme-oriented sessions.
Registration fee includes all meals, refreshments, social activities, and conference and exhibit attendance, as well as the printed Proceedings distributed at the Workshop. The workshop concludes Wednesday at Noon, June
15, after the awards presentation and luncheon.
