The 20th annual SW Test Workshop is the only IEEE-sponsored conference that focuses on all aspects of semiconductor wafer and die level probe testing. The workshop begins Sunday afternoon, June 6, with a tutorial and three presentations, followed by a welcome reception, dinner, and a Keynote Speaker. The Technical Program begins Monday morning with 30-minute presentations in theme-oriented sessions. Advanced registration is $580 for IEEE members and $700 for non-members, and includes all meals, refreshments, social activities, and conference and exhibit attendance, as well as the printed Proceedings distributed at the Workshop. The workshop concludes Wednesday at Noon, June 9, after the awards presentation and luncheon.
