The annual SW Test Workshop is the only IEEE-sponsored conference that focuses on all aspects of semiconductor wafer and die level probe testing.
The workshop begins Sunday afternoon, June
10, with a tutorial and three presentations, followed by a welcome reception, dinner, and a Keynote Speaker. The Technical Program begins Monday morning with 30-minute presentations in theme-oriented sessions.
The workshop concludes Wednesday at Noon, June
13, after the awards presentation and luncheon.
Registration fee includes receptions and dinners Sunday, Monday and Tuesday; AM & PM refreshment breaks Monday, Tuesday; PM refreshment breaks Sunday and Wednesday; lunch Monday, Tuesday and Wednesday; a Social Event; the Technical Conference and EXPO admission, as well as the electronic Proceedings distributed at the Workshop.
