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The Test Technology Technical Committee of the
IEEE Computer Society sponsors over twenty-five similar workshops
in various areas of test technology. This is the only IEEE conference
that deals specifically with wafer level testing. The two and
one half-day event starts Sunday afternoon with registration,
a reception, a buffet dinner, and a panel discussion. The conference
adjourned on Wednesday at noon, in time to get most participants
back to work by Thursday morning. In the past eight years, it
has grown to over 475 attendees with many international visitors.
Program Committee Members:
Bill Mann, General Chair, william.mann@ieee.org
Rey Rincon, Texas Instruments, Program Chair, r-rincon@ti.com
Jerry Broz, Texas Instruments,
Technical Program Vice-Chair, j-broz@ti.com
Mike Bonham, Cerprobe, mbonham@cerprobe.com
Jeanette Roberts, Intel, jeanette.roberts@intel.com
Tom Foerster, Conexant, thomas.foerster@conexant.com
Dale Gleason, Agilent, dale_gleason@agilent.com
January Kister, Probe Tech, january.kister@probecard.com
Phil Seitzer, Lucent, seitzer@lucent.com
Fred Taber, IBM, taber@ibm.com |
