Schedule-At-A-Glance

Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
19:00
19:30
20:00
20:30
SWTEST Golf Tournament
Golfers Breakfast (Valley Promenade)
William Mann Memorial Golf Tournament (Omni La Costa Golf Resort - Starter Area - Legends course)
 
Registration
 
Conference Registration Check-In (Costa de la Luna Foyer)
 
Attendees Welcome Mixer (Bar Traza)
 

Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
19:00
19:30
20:00
20:30
21:00
21:30
22:00
22:30
EXPO day 1 (Costa Del Sol)
Exhibitor Check-In (Costa de la Luna Foyer)
Exhibitor Setup (Costa Del Sol Ballroom)
 
EXPO Open (Costa Del Sol Ballroom)
Sponsor Hospitality Events
 

Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
19:00
19:30
20:00
20:30
21:00
21:30
22:00
22:30
Poster Day 2 (Costa de la Luna Foyer)
 
Poster Session (Costa de la Luna Foyer)
 
EXPO day 2 (Costa Del Sol)
Conference Registration Check-In (Costa de la Luna Foyer)
 
SWT Crew Mixer (Costa Del Sol Side Lawn)
EXPO Open / Reception (Costa Del Sol Ballroom)
Sponsor Hospitality Events
 

Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
EXPO day 3 (Costa Del Sol)
Exhibitor Teardown (Costa Del Sol Ballroom)
 

Detailed Schedule

Time Event
7:00 - 8:00
Golfers Breakfast (Valley Promenade)
8:00 - 13:30
William Mann Memorial Golf Tournament (Omni La Costa Golf Resort - Starter Area - Legends course)
13:00 - 17:00
Conference Registration Check-In (Costa de la Luna Foyer)
17:30 - 20:00
Attendees Welcome Mixer (Bar Traza)

Time Event
7:00 - 8:00
Speakers' Breakfast (Las Palmas 1 and 2)
7:00 - 8:00
Continental Breakfast (Costa de la Luna Courtyard/Lawn)
7:00 - 16:00
Conference Registration Check-In (Costa de la Luna Foyer)
7:00 - 12:00
Exhibitor Check-In (Costa de la Luna Foyer)
8:00 - 9:15
Poster Setup
8:00 - 8:15
Welcome to SWTEST San Diego
Jerry BROZ (SWTest Conference, USA)
8:15 - 9:15
Speaker Headshot
Keynote Speaker
Known Good Die as a Key Enabler for Advanced Packaging in a Disaggregated World
Intel Corporation - USA
9:15 - 10:00
Coffee Break and Poster Session
10:00 - 12:00
Session 1: RF Applications
Session Chair: Raffaele VALLAURI (Technoprobe SpA, Italy)
10:00 - 10:30
Narrow Pitch Impedance Standard Substrates (ISS) for Pyramid Probe Applications
Pratik GHATE (FormFactor, Inc. - USA)
Presenter Headshot
10:30 - 11:00
Characterization of High Performance RF Vertical Probe Heads
Daniel BOCK (Probe Test Solutions Limited - USA)
Presenter Headshot
11:00 - 11:30
Next Generation Probe Card Design for 112Gbps PAM4 Test Solution
Johnson TSENG (Chunghwa Precision Test Tech. Co., Ltd. - USA), Jhih-Hong CHENG, Kimmie CHEN (Chunghwa Precision Test Tech. Co., Ltd. - Taiwan)
Presenter Headshot
11:30 - 12:00
Risk Mitigation Strategies for mmWave Production Test Environments
Kevin AYERS, Ryan GARRISON (FormFactor, Inc. - USA)
Presenter HeadshotPresenter Headshot
12:00 - 16:00
Exhibitor Setup (Costa Del Sol Ballroom)
12:00 - 13:30
Lunch
13:30 - 15:00
Session 2: Optical Device Testing Challenges
Session Chair: Mark OJEDA (Infineon Semiconductor, USA)
13:30 - 14:00
Probe Heads for Optical Wafer-Level Testing
Philipp DIETRICH, Andrés MACHADO, Florian RUPP (Keystone Photonics GmbH - Germany)
Presenter Headshot
14:00 - 14:30
Novel direct probe solution for opto-electronic wafer-level PIC testing
Golam BAPPI (Ayar Labs - USA), Tobias GNAUSCH (Jenoptik Optical Systems GmbH - Germany)
Presenter HeadshotPresenter Headshot
14:30 - 15:00
Optical edge coupling method for fully automated PIC wafer-level testing
Anna PECZEK (IHP Leibniz- Institut f. innovative Mikroelektronik - Germany), Dan RISHAVY (FormFactor, Inc. - USA)
Presenter HeadshotPresenter Headshot
15:00 - 15:30
Coffee Break and Poster Session
15:30 - 17:00
Session 3: Probe Potpourri
Session Chair: Davide APPELLO (Technoprobe SpA, Italy)
15:30 - 16:00
Probing Technologies for KGD Testing: Choosing Between Needle Probes and Pogo Pins
Michael LAWSON, Luca FANELLI, Sara MONFREDA (SPEA S.p.A. - Italy)