Schedule-At-A-Glance
Sunday, June 2nd, 2024
Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
19:00
19:30
20:00
20:30
SWTEST Golf Tournament
Golfers Breakfast (Valley Promenade)
William Mann Memorial Golf Tournament (Omni La Costa Golf Resort - Starter Area - Legends course)
Registration
Conference Registration Check-In (Costa de la Luna Foyer)
Attendees Welcome Mixer (Bar Traza)
Monday, June 3rd, 2024
Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
19:00
19:30
20:00
20:30
21:00
21:30
22:00
22:30
Tech Session day 1 (Costa de la Luna)
Continental Breakfast (Costa de la Luna Courtyard/Lawn)
Welcome to SWTEST San Diego
Keynote Speaker
Coffee Break and Poster Session
Session 1: RF Applications
Lunch
Session 2: Optical Device Testing Challenges
Coffee Break and Poster Session
Session 3: Probe Potpourri
Poster Day 1 (Costa de la Luna Foyer)
Poster Session (Costa de la Luna Foyer)
Poster Session (Costa de la Luna Foyer)
EXPO day 1 (Costa Del Sol)
Exhibitor Check-In (Costa de la Luna Foyer)
Exhibitor Setup (Costa Del Sol Ballroom)
EXPO Open (Costa Del Sol Ballroom)
Sponsor Hospitality Events
Tuesday, June 4th, 2024
Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
19:00
19:30
20:00
20:30
21:00
21:30
22:00
22:30
Tech Session Day 2 (Costa de la Luna)
Continental Breakfast (Costa de la Luna Courtyard/Lawn)
SWT Crew Update
Keynote Speaker
Coffee Break and Poster Session
Session 4: RF, High Volume-Test and Advanced Applications
Lunch
Session 5: Temperature Testing Challenges
Poster Day 2 (Costa de la Luna Foyer)
Poster Session (Costa de la Luna Foyer)
EXPO day 2 (Costa Del Sol)
Conference Registration Check-In (Costa de la Luna Foyer)
SWT Crew Mixer (Costa Del Sol Side Lawn)
EXPO Open / Reception (Costa Del Sol Ballroom)
Sponsor Hospitality Events
Wednesday, June 5th, 2024
Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
Tech Session Day 3 (Costa de la Luna Ballroom)
Continental Breakfast (Costa de la Luna Courtyard/Lawn)
Session 6: New Probe Materials
Break
Session 7: Process Optimization
Awards Presentations
Conference Adjourns
EXPO day 3 (Costa Del Sol)
Exhibitor Teardown (Costa Del Sol Ballroom)
Type
TBD
Technical Session (Podium - has abstracts assigned)
Poster Session (Poster - has abstracts assigned)
Tech Showcase (not abstract but sessions (one for each showcase))
Other (like Expo - no abstracts/slots)
Hidden in the Program at a Glance
Name
Session Chair
TBD...
Mr. Davide APPELLO (Technoprobe SpA - Cernusco Lombardone (LC), Italy)
Ms. Karen ARMENDARIZ (Celadon Systems - Burnsville, USA)
Mr. Alfredo BENSO (Politecnico di Torino - Torino, Italy)
Dr. Jerry BROZ (SWTest Conference - Longmont, USA)
Mr. John CALDWELL (MJC Electronics Corporation - Meridian, USA)
Mr. Geert GOUWY (IMEC - Leuven, Belgium)
Dr. Michael HUEBNER (FormFactor - Livermore, USA)
Mr. Nobuhiro KAWAMATA (FormFactor - Yokohama, Japan)
Mr. Alistair LAING (Micron Technology - Boise, USA)
Mrs. Amy LEONG (FormFactor Inc. - San Jose, USA)
Mr. Clark LIU (MJC Taiwan - HsinChu County, Taiwan)
Mr. Grace LIU (Intel Corporation - Hillsboro, USA)
Mr. Karan MANIAR (AEM - San Jose, USA)
Mr. Muru MEYYAPPAN (ENFABRICA - Mountain View, USA)
Mr. Patrick MUI (JEM America - Fremont, USA)
Mr. Mark OJEDA (Infineon Semiconductor - San Jose, USA)
Mr. Rey RINCON (SWTest Conference - Austin, USA)
Mrs. Connie SMITH (Texas Instruments - Dallas, USA)
Mr. Raffaele VALLAURI (Technoprobe SpA - Cernusco Lombardone, Italy)
Mr. Joey WU (STAr Technologies - Hsinchu, Taiwan)
Slots
Start
End
ShowOrder
Abstracts:
Day
Detailed Schedule
Sunday, June 2nd, 2024
Time
Event
7:00 - 8:00
Golfers Breakfast (Valley Promenade)
8:00 - 13:30
William Mann Memorial Golf Tournament (Omni La Costa Golf Resort - Starter Area - Legends course)
13:00 - 17:00
Conference Registration Check-In (Costa de la Luna Foyer)
17:30 - 20:00
Attendees Welcome Mixer (Bar Traza)
Monday, June 3rd, 2024
Time
Event
7:00 - 8:00
Speakers' Breakfast (Las Palmas 1 and 2)
7:00 - 8:00
Continental Breakfast (Costa de la Luna Courtyard/Lawn)
7:00 - 16:00
Conference Registration Check-In (Costa de la Luna Foyer)
7:00 - 12:00
Exhibitor Check-In (Costa de la Luna Foyer)
8:00 - 9:15
Poster Setup
8:00 - 8:15
Welcome to SWTEST San Diego
Jerry BROZ (SWTest Conference, USA)
8:15 - 9:15
Keynote Speaker
Known Good Die as a Key Enabler for Advanced Packaging in a Disaggregated World
Joseph PARKS
Intel Corporation - USA
9:15 - 10:00
Coffee Break and Poster Session
10:00 - 12:00
Session 1: RF Applications
Session Chair: Raffaele VALLAURI (Technoprobe SpA, Italy)
10:00 - 10:30
Narrow Pitch Impedance Standard Substrates (ISS) for Pyramid Probe Applications
Pratik GHATE
(FormFactor, Inc. - USA)
10:30 - 11:00
Characterization of High Performance RF Vertical Probe Heads
Daniel BOCK
(Probe Test Solutions Limited - USA)
11:00 - 11:30
Next Generation Probe Card Design for 112Gbps PAM4 Test Solution
Johnson TSENG
(Chunghwa Precision Test Tech. Co., Ltd. - USA), Jhih-Hong CHENG, Kimmie CHEN (Chunghwa Precision Test Tech. Co., Ltd. - Taiwan)
11:30 - 12:00
Risk Mitigation Strategies for mmWave Production Test Environments
Kevin AYERS
,
Ryan GARRISON
(FormFactor, Inc. - USA)
12:00 - 16:00
Exhibitor Setup (Costa Del Sol Ballroom)
12:00 - 13:30
Lunch
13:30 - 15:00
Session 2: Optical Device Testing Challenges
Session Chair: Mark OJEDA (Infineon Semiconductor, USA)
13:30 - 14:00
Probe Heads for Optical Wafer-Level Testing
Philipp DIETRICH
, Andrés MACHADO, Florian RUPP (Keystone Photonics GmbH - Germany)
14:00 - 14:30
Novel direct probe solution for opto-electronic wafer-level PIC testing
Golam BAPPI
(Ayar Labs - USA),
Tobias GNAUSCH
(Jenoptik Optical Systems GmbH - Germany)
14:30 - 15:00
Optical edge coupling method for fully automated PIC wafer-level testing
Anna PECZEK
(IHP Leibniz- Institut f. innovative Mikroelektronik - Germany),
Dan RISHAVY
(FormFactor, Inc. - USA)
15:00 - 15:30
Coffee Break and Poster Session
15:30 - 17:00
Session 3: Probe Potpourri
Session Chair: Davide APPELLO (Technoprobe SpA, Italy)
15:30 - 16:00
Probing Technologies for KGD Testing: Choosing Between Needle Probes and Pogo Pins
Michael LAWSON
, Luca FANELLI, Sara MONFREDA (SPEA S.p.A. - Italy)