Schedule-At-A-Glance
Wednesday, October 23rd, 2024
Start
19:00
19:30
20:00
20:30
21:00
21:30
22:00
22:30
23:00
23:30
EXPO Carry-In/Setup
EXPO Carry-In/Setup from 10/23 20:00 to 23:00
Thursday, October 24th, 2024
Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
19:00
19:30
20:00
20:30
Technical Session (ARGOS A-B 1st Floor)
Fukuoka Governor Welcome
Visionary Keynote
Break
Session 1 Practical Test Solutions from MEMS, Power, and Optical
Lunch
Session 2 Innovative Testing Solutions for High-Performance Devices
Break
Session 3 Challenges of Advanced Devices and Complex Systems
Poster (Grand Foyer 1st floor)
Poster Session
Poster Session
Tech Showcase (Navis C 1st Floor)
FormFactor:
MPI:
Japan Electronic Material Corp:
EXPO (ARGOS C-F 1st Floor)
EXPO Move-in
EXPO Open
Kagamiwari Ceremony & Welcome Reception
Friday, October 25th, 2024
Start
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
19:00
19:30
20:00
20:30
21:00
21:30
Technical Session (ARGOS A-B 1st Floor)
Friday Overview
Keynote Speaker
Keynote Speaker
Break
Session 4 Advancing Wafer Probing Efficiency and Quality
Lunch
Session 5 High-Speed KGD and Power Module Testing Challenges
Break
Session 6 Probe Card MLO and PCB Design for High-Speed
Awards
Poster (Grand Foyer 1st floor)
Poster Session
Poster Session
Tech Showcase (Navis C 1st Floor)
MJC
Teraprobe:
EXPO (ARGOS C-F 1st Floor)
EXPO Open
EXPO Move-out
Japanese Street Food Festival (Olive/Garden 5th Floor)
Saturday, October 26th, 2024
Start
5:30
6:00
6:30
7:00
7:30
8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
Charity Golf Tournament and Networking
2024 SWTest Asia Charity Golf Tournament (The Classic Golf Club)
Type
TBD
Technical Session (Podium - has abstracts assigned)
Poster Session (Poster - has abstracts assigned)
Tech Showcase (not abstract but sessions (one for each showcase))
Other (like Expo - no abstracts/slots)
Hidden in the Program at a Glance
Name
Session Chair
TBD...
Jerry BROZ (SWTest Conference Chair - Longmont, USA)
Tracy BROZ
John CALDWELL (MJC Electronics Corporation - Meridian, USA)
Eric Chia-Cheng CHANG (Intel - -, USA)
Alan FERGUSON (Oxford Lasers - Didcot, United Kingdom)
Kim JOONYOUN (Samsung - -, South Korea)
Nobuhiro KAWAMATA (FormFactor - Yokohama, Japan)
Yoichi KUROKI (Tera Probe - -, Japan)
Clark LIU (MJC Taiwan - HsinChu County, Taiwan)
Muru MEYYAPPAN (Marvell Technology - Santa Clara, USA)
Patrick MUI (JEM America - Fremont, USA)
Masahide OZAWA (MJC - -, Japan)
Rey RINCON (SWTest Conferences - Austin, USA)
Masatomo TAKAHASHI (Accretech - Hachioji, Japan)
Kenny TANG (tsmc Corporation - Hsinchu, Taiwan)
Nyi Nyi THEIN (Western Digital Corporation - Yokohama , Japan)
Joey WU (SW Test Workshop - Chupei, Taiwan)
Alex YANG (MPI Corporation - Chu-Pei, Taiwan)
Slots
Start
End
ShowOrder
Abstracts:
Day
Detailed Schedule
Wednesday, October 23rd, 2024
Time
Event
20:00 - 23:00
EXPO Carry-In/Setup from 10/23 20:00 to 23:00
Thursday, October 24th, 2024
Time
Event
7:30 - 9:30
EXPO Move-in
7:30 - 17:30
Attendees Registration Check-In
8:45 - 9:15
Fukuoka Governor Welcome
Jerry BROZ (SWTest Conference Chair, USA)
9:15 - 10:00
Visionary Keynote
Silicon Seabelt 2.0: Challenges of Kyushu for Reproduction of Silicon Island
Hiroto YASUURA
National Institute of Information - Japan
10:00 - 10:30
Break
10:00 - 17:30
EXPO Open
10:30 - 12:00
Session 1 Practical Test Solutions from MEMS, Power, and Optical
Session Chair: Eric Chia-Cheng CHANG (Intel, USA)
10:30 - 11:00
Novel True-Kelvin MEMS Analytical DC Probes to enable Accurate and Repeatable Characterization of Advanced-Node devices for AI applications
Choon Beng SIA
(FormFactor Inc - Singapore),
Masa WATANABE
(FormFactor Japan - Japan)
11:00 - 11:30
Consideration of Resistance with Shared Power line for High Current device
Shoichi MATSUO
(Micron Memory Japan Inc. - Japan)
11:30 - 12:00
From Lab to Line: Enabling Efficient PIC Testing for Mass Production
Andrew YICK
, Andy CHANG, Calvin YANG, Supreet KHANAPET (Marvell - USA), Christian KARRAS, Tobias GNAUSCH (Jenoptik - Germany)
12:00 - 14:00
Lunch
14:00 - 15:30
Session 2 Innovative Testing Solutions for High-Performance Devices
Session Chair: Clark LIU (MJC Taiwan, Taiwan)
14:00 - 14:30
Addressing High-Speed Devices: Strengthening and Advancing MEMS Probe Cards
Masataka KIMOTO
(MICRONICS JAPAN CO.,LTD - Japan),
Yuka HOMAN
(MICRONICS JAPAN CO.,LTD. - Japan), Shinji TANAKA (MICRONICS JAPAN - Japan)
14:30 - 15:00
A novel memory test system with an electromagnet for STT-MRAM wafer level testing
Masaharu TSUTA
(Tohoku University - Japan), Masatomo TAKAHASHI (Accretech - Japan)
