1999 Southwest Test Workshop Program

(View the original proceedings - a "large" Adobe Acrobat file)

About The Workshop

Four hundred fifty wafer test professionals met at the Paradise Point Resort Hotel in San Diego, California, from June 6 through 9, 1999. The record number of attendees makes this workshop the largest of the many supported by the Test Technology Technical Council. Each year the technical program has improved with its balanced mixture of wafer test equipment vendor and user presentations as well as a lot of panel and open discussions. This year the Program Committee continued that improvement trend with a tutorial, two panel discussions, and outstanding after dinner speaker, and 32 excellent technical presentations.

The program began Sunday afternoon with a Tutorial on "Probe Card Evaluation Methods," a reception and buffet dinner, and a panel discussions on "Fine Pitch Probing" that evening. The first session Monday morning was on Vertical Probing Technology for area array designs. The next session discussed another hot topic in wafer testing, Probe Card Cleaning. After lunch, the conference had three presentations on Full Contact Wafer Probe and Burn In. Following the break, we had a special session where six microelectronic manufacturers candidly discussed the painful "Lessons Learned In New Probe Technology Introductions." They gave examples of fine pitch, multi-site, high pin count, and RF Membrane cards, dramatic production ramp up, and parallel X32 and X64 memory probing. Extensive attendee questions and comments were an important part of this session and the panel discussion on Sunday evening.

After a hard day of wafer test technology, the workshop attendees relaxed at the hotel's Barefoot Bar. To stimulate the informal interaction, we had a Team Techno-Trivia contest where each team member had to be from a different company. The groups turned in their answer sheets, and then they enjoyed a great dinner. To culminate the evening, we had a special "Build-It-Yourself, Ice Cream Sunday Contest."

Tuesday morning began with the Probe Potpourri Session in which the presentations addressed a wide range of probe related issues. Then the workshop had an extended session dealing with the hottest topic in wafer testing technology, the correlation problems between the probe card analyzers and the in-situ performance of the cards.

After lunch, we enjoyed a little leisure and networking time with some social activities. All the attendees and their spouses were invited to play miniature golf on the hotel's course, go on a Mission Bay Cruise, visit the world famous UC San Diego, Scripps Aquarium, or just relax and enjoy the resort hotel.

Tuesday evening we had another cocktail reception followed by a gourmet dinner with courtesy SWTW wineglasses for all, and our awards ceremony. We honored the overall best presentation, best data presented, and the most inspired presentation. Then we had some more fun with the best scores from the Techno-Trivia Contest, best and the biggest Ice Cream Sundays, lowest Miniature golf score, worse sunburn, and the infamous "Royal Order Of The Golden Wheelbarrow Full Of Crap" for the poorest discussed sales pitch by a presenter. To be fair, ALL of our Wednesday presenters also received awards. Bill Bottems gave a fascinating after-dinner presentation about some significant trends in the Microelectronic Industry.

It was back to work on Wednesday morning. We had a special invited session from SEMI on the status of their numerous standards activities for the wafer test business. Our final session Wednesday morning covered three new probe technologies recently introduced. The conference was adjourned, and everyone is looking forward our tenth annual conference that begins on Sunday, June 11, 2000.

Copyright Notice

  • The papers in this publication comprise the proceedings of the 1999 Southwest Test Workshop. They reflect the authors’ opinions and are reproducted as presented , without change. Their inclusion in this publication does not constitute an endorsement by the Southwest Test Workshop, the sponsors, or the Institute of Electrical and Electronic Engineers, Inc.
  • There is NO copyright protection claimed by this publication. However, each presentation is the work of the authors and their respective companies: as such, proper acknowledgement should be made to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author/s or their companies.

The Committee

  • Bill Mann – General Chairman
  • Mike Bonham – Cerprobe
  • Rey Rincon – Texas Instruments
  • Dave Unzicker – Intel
  • Al Miller – Intel
  • Phil Seitzer – Lucent Technologies
  • Jerry Broz – Texas Instruments
  • Tom Foerster – Conexant
  • January Kister – Probe Technology

What is a Test Workshop?

  • It’s Not a Theoretical or Academic Conference
  • Workshops are Informal and Casual
  • Provides Practical Solutions to Real Problems
  • Mixture of Vendor and User Presentations
  • Open Discussions and Networking
  • Opportunity for Informal and Casual Interactions

Informal Interaction

  • Long Breaks….Talk with a Stranger
  • Three Hosted Cocktail Receptions
  • Extensive Social Activities
    • Barefoot Bar Trivia Contest
    • Ice Cream Sunday Contest
    • Miniature Golf Tournament
    • Scripps Aquarium
    • Mission Bay Cruise

TTTC: Test Technology Technical Council



Sunday - June 6, 1999 - 2:00pm

Probe Card Evaluation Process

Dave Unzicker
Intel Corporation, FM3-25

Vertical Probing

Monday - June 7, 1999 - 8:30am

Overview of C4 Area Array Probing

Justin Leung, Ph.D.
Intel Corp.

Modeling the Array Force in C4 Probe-Cards During Wafer Sort

Arun Ramamoorthy and Rahima K. Mohammed
Intel Corp.

Advances in Performance of Buckling Beam Probes

Dean Gonzales
Intel Corp.

January Kister
Probe Technology

Probe Card Cleaning

Monday - June 7, 1999 - 10:30am

Low CRES with Reduced Cleaning…A Paradigm Shift

Jerry Broz, Ph.D.
Advanced Probing Systems, Inc.

Rey Rincon
Texas Instruments Corp.

Membrane Cards with Microscrub Technology

Ken Smith
Cascade Microtech, Inc.

EHD (Electro-hydrodynamic) for Cleaning Probe Cards

James Andersen
Applied Precision, Inc.

Form Factor’s No-Clean Probe Card Technology

Mark Brandemuehl
Form Factor, Inc.

Full Contact Wafer Probe and Burn-In

Monday - June 7, 1999 - 1:00pm

WLBI and Test System Considerations

Mark Carbone
Aehr Test Systems

Full Wafer Burn-In and Test

John Mosko and John Budnaitis
W.L. Gore

Wafer-On-Wafer Technology for WLBI

Dave Pedersen
Form Factor., Inc.

Probe Potpourri

Tuesday - June 8, 1999 - 8:00am

Introduction of the X32 Test in IBM Essonnes France

Dominique Langlois
IBM Essonnes

Advances in Conventional Cantilever Probe Cards

Krzysztof Dabrowiecki
Probe Technology

Effects of Lower Force Interfacing Solutions on Wafer-Test Systems

Mark Wojcik
CerProbe Corp.

Analyzer to Probe Mark Correlation

Tuesday - June 8, 1999 - 10:00am

Can I Correlate My Probe Card

Heather McGill and Nasser Ali Jafari
Intel Corp.

Probers as the Primary Metrology Tool

Dia Dee Casavant

Statistical Approach to PCA Correlation/Comparison

Larry Cowart

Hank Scutoski
CerProbe Corp.

A Study of the Probing Process

John Strom
Applied Precision, Inc.

Analyzer-Prober Correlation

Rod Schwartz
Integrated Technology Corp.

SEMI Standards Activities

Wednesday - June 9, 1999 - 8:00am

Overview of SEMI Standards Activities

Bettina Weiss

Automatic Prober Headplate/Ring Carrier Standardization

Jim Anderson
CerProbe Corp.

Probe Card Correlation Task Force

Roger Sinsheimer

Bill Knauer
Keithley Instruments

Wafer Map Standards

Dave Huntly
Kinesys Software Inc.

New Probe Technology

Wednesday - June 9 ,1999 - 10:00am

The Necessities Of New Probe Card Technologies

Frank Pietzchmann
Infineon GmbH

Vertical Scrub Probe Card

Mark Godfrey
Prime Yield Systems Inc.

Microstrip Beam Technology Update

Lynn Saunders
MicroConnect, Inc.

Rey Rincon
Texas Instruments Corp.

J-Probe System

Joe Mai
JEM America

Prizes, Prizes and More Prizes

  • Best Technical Presentation
  • Best Data Presented
  • All Panel Members
  • Best Questions Asked
  • A Few Surprise Awards
  • Tuesday Awards Banquet
  • All Presenters on Wednesday

Test Technology Periodicals

  • International Test Conference Proceedings
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  • Test Technology Technical Committee
    1474 Freeman Drive
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  • Journal of Electronic Testing
    Kiuwer Academic Publishers
    101 Philip Drive
    Norwell, MA 02061
  • Design and Test of Computers
    IEEE Computer Society
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    Los Alamitos, CA 90720-1314
  • Final Test Report
    Ikonix Corporation
    P.O. Box 1938
    Lafayette, CA 94549
  • Evaluation Engineering
    Nelson Publishing
    2504 N. Tamiami Trail
    Nokomis, FL 34275-3428

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