2003 Southwest Test Workshop
(Each presentation is in Adobe Acrobat format)

TABLE OF CONTENTS

Cost of Test Tutorial
Dinner Guest Speaker
Opening Session - Chairman's Welcome
Session 1 - New Probe Technologies
Session 2 - Memory Probing
Session 3 - Vertical Probe Challenges
Session 4 - Metal Stack / Dielectric Characterization
Session 5 - MEMs Technologies
Session 6 - Controlling Contact Resistance
Session 7 - Probe Process Characterization
Session 8 - Advances in Probe Card Analyzers

 

"A High Parallelism, High Bandwidth Probe Card using SiFi MEMS Probes"

Keith Lee Bob Aldaz Yu Zhou, Ph.D. David Yu, Ph.D. Gert Hohenwarter Tassos Golnas Advantest America, Inc. Buffalo Grove, IL 847-821-3204

"Vertical Micro-Probe Design Based on the EFABTM Micro-Fabrication Process"

Chris Bang Nelsimar Vandelli MEMGen Corporation 1103 W. Isabel St. Burbank, CA 91506 818-295-3996 cbang@memgen.com nvandelli@memgen.com

Session 2 - MEMORY PROBING
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8  

"High Throughput Challenges for 300mm Wafer Testing"

Clark Liu Powerchip Semiconductor Corp NO 12 LI-HSIN RD.I , SBIP HsinChu, Taiwan,300 886-3-5792131 clarkl@psc.com.tw

Nobuhiro Kawamata FormFactor, Inc., Asia Re-Ju Oh-imachi Bldg. 7F 4-13-17, Oh-i, Shinagawa-ku Tokyo 140-0014 81-3-5746-3100 nkawamata@formfactor.com

Ken Taoka Tokyo Electron Limited 2381-1 Kitagejo Fujii-cho, Nirasaki City Yamanashi  407-8511 Japan 81-551-23-2148

"Critical Factors in Testing MRAM Devices"

Bill Stevenson Cypress Semiconductor 3901 North First Street San Jose, CA 95134-1599 408-456-1926

George Asmerom Chris Taylor Electroglas Inc. 6024 Silver Creek Valley Rd San Jose, CA 95138 408-528-3325

"Memory XXL Another Step on the Way to Full Wafer Probing - 256 DUT on Beta-mode"

Klaus Giringer Gunther Boehm FEINMETALL GMBH Zeppelinstraße 8 D- 71083 Herrenberg 0 70 32 / 20 10 - 0 info@feinmetall.de

Session 3 - VERTICAL PROBE CHALLENGES
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8

"International SEMATECH Wafer Probe Council Report on Vertical Probing Experiences"

Frederick L. Taber IBM Microelectronics Zip 5E1 2070 Route 52 Hopewell Junction, NY 12533 845-894-2348 taber@us.ibm.com

Gavin Gibson Infineon Technologies Room 02/352 St Martin Straße 76 D-81541 Munich, Germany 49-89-234-28290 gavin.gibson@infineon.com

"Hybrid Buckling Beam Contact for Vertical Probe Cards"

Robert Murphy Wentworth Laboratories, Inc. 101 Commerce Drive Brookfield, CT  06804 408-919-1875 x 29 rmurphy@wentworthlabs.com

"Ultimate Frequency Limitations of Cobra Probe Contactors"

Raphael Robertazzi IBM T.J. Watson Research Center Building 801 Rt 134 MS 13-257 Yorktown Heights, NY 10598 914-945-3620 tazzi@us.ibm.com

Winner - Best Presentation, Tutorial in Nature
"Predicting the Performance of Sort Tooling to 40 Gb/s"

Brett Grossman Intel Corp. 2501 NW 229th Street RA2-215 Hillsboro, OR 97124 971-214-5107 Brett.Grossman@intel.com

Bryan Boots Ansoft Corporation 3800 Arapahoe Boulevard Suite 250 Boulder, CO 80303 303-541-9525 bboots@ansoft.com

Session 4 - METAL STACK / DIELECTRIC CHARACTERIZATION
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8  


"Multi-site Probing for Wafer-Level Reliability"

"MicroForce™ Probing for low-k ILD Testing"

Session 5 - MEMS TECHNOLOGIES
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 

"MEMs Technology in Testing"

"Multi-die Testing using Silicon Micro-Cantilever Probe Card"

Session 6 - CONTROLLING CONTACT RESISTANCE
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8  

"On the Way to 30-um Pads - A New Generation of Kerf Cards"

Winner - Most Inspirational Presentation
"44 Micron Pitch Probe Capabilities Assessment"

Session 8 - ADVANCES IN PROBE CARD ANALYZERS
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 

"Test and Maintenance of Very High Pin Count Cards"

Bill Williams, Motorola