(Each presentation is in Adobe Acrobat format)
Jerry Broz, Ph.D.
General Chair
SW Test Workshop
Brett Crump
Technical Program Chair
SW Test Workshop
Jeff Greenberg
Rudolph Technologies
Darren James
SW Test Committee
Rudolph Technologies
Jerry Broz, Ph.D.
SW Test Workshop
Risto Puhakka
VLSI Research
Jerry Broz, Ph.D.
SW Test Workshop
Michael Huebner, Ph.D.
FormFactor, Inc.
Scott Lindsey, Ph.D. and Chris Buckholtz
Aehr Test Systems
Simon Allgaier and Gunther Boehm
Feinmetall GmbH
Scott Clegg and Krzysztof Dabrowiecki
Probelogic
Shoichi Asanuma
TOTO
Darren James
Rudolph Technologies
Satoshi Sasaki and Yoshiro Nakata
Chip Test Technology Research Lab, Association of Super-Advanced Electronics Technologies
Gert Hohenwarter
GateWave Northern
Winner - Best Presentation, Tutorial in Nature
Jim Brandes
Everett Charles Technologies
Jason Mroczkowski and Ryan Satrom
Everett Charles Technologies
Winner - Most Inspirational Presentation
Mark Winn
Intel Corp.
Rob Marcelis
Salland Engineering
Brad Lawrence
Aceris-3D Instruments
Rod Schwartz
Integrated Technology Corp
Wolfgang Schaefer, Ph.D. and Gunther Boehm
Feinmetall GmbH
Winner - Best Data Presentation
Cameron Harker, Jeff Lin, and Stuart Pearce
FormFactor, Inc.
Sanghoon Lee, Ph.D., Sejang Oh, Kyeongseon Shin, and Wuisoo Lee
Samsung Electronics
Terence Q. Collier
CVInc
Jan Martens
NXP Semiconductors (Hamburg)
Simon Allgaier
Feinmetall GmbH
Jerry Broz, Ph.D.
International Test Solutions
Rainer Gaggl, Ph.D.
T.I.P.S. Messtechnik GmbH
Dominique Langlois
Altis Semiconductor
Herve Alle
SEMI Consulting
Daniel Watson
Teradyne
Mark Roos
Roos Instruments
Roger Hayward
Cascade Microtech
Mike Slessor, Ph.D. and January Kister
MicroProbe
Christian Degan, Ph.D., Oliver Nagler, Ph.D., and Mahmoud Nouri
Infineon GmbH
Brad Lawrence
Aceris-3D Instruments
Bahadir Tunaboylu, Ph.D. and Gerald Back
SV Probe
Yuan Huang, Gary Liu, and Thompson Hsu
United Microelectronics Corp (UMC)
Wensen Hung, Cahris Lin, and Dean Yang
MPI – Taiwan
Winner - Best Technical Presentation
James Tong and Norm Armendariz, Ph.D.
Texas Instruments
John Wolfe, Norm Armendariz, Ph.D., and James Tong
Texas Instruments
Fred Megna and Sato Minoru
Micronics Japan (MJC)
Boyd Daniels
ISMI Probe Council Chair
Sammy Mok
VeraConnex
Krzysztof Dabrowiecki and Scott Clegg
Probelogic
Gordon A. Vinther
Ardent Concepts
The presentations included in the SWTW proceedings reflect the authors opinions and are presented without change. Inclusion in the proceedings does not constitute an endorsement by the SouthWest Test Workshop Committee, IEEE CPMT Society, IEEE Computer Society or the IEEE Test Technology Council.
Papers previously copyrighted or with copyright restrictions cannot be presented. In keeping with a workshop environment and to avoid copyright issues, SWTW does not officially seek a copyright ownership / transfer from authors. Authors agree by submitting their work that their presentation is original work and substantially not published previously or copyrighted, may be referenced in the work of others, will be assembled / distributed in the SWTW Proceedings, and made available for download by anyone from the SWTW website.