Brett Debenham is the Senior Director of Test Probe Central Engineering at Micron Technology, Inc., in Boise, Idaho. Since joining Micron in 1992, he has held various key technical and managerial positions for DRAM Probe and Test Engineering. Currently, he is responsible for managing Micron’s global engineering for NVM and DRAM Probe, package test, module test, and SSD. Mr. Debenham earned a B.S. degree in Electrical Engineering from the University of Utah and holds multiple US patents.