Brett Debenham is the Senior Director of Test Probe Central Engineering at Micron Technology, Inc., in Boise, Idaho. Since joining Micron in 1992, he has held various key technical and managerial positions for DRAM Probe and Test Engineering. Currently, he is responsible for managing Micron’s global engineering for NVM and DRAM Probe, package test, module test, and SSD. Mr. Debenham earned a B.S. degree in Electrical Engineering from the University of Utah and holds multiple US patents.
Keynote Presentation Information
Leveraging Advanced Manufacturing to Address Challenges in the Automotive Memory Market.
Advanced manufacturing is enabling Industry 4.0. We will review key concepts and solutions enabled at Micron. This talk will review industry trends in the automotive market and the resulting memory test challenges needed to support these requirements. Additionally, we will touch on how Big Data can help move manufacturing environments toward the goal of zero-defects.