The SWTest Committee is an international group of experienced probe technologists that volunteer their time and efforts to help develop the Technical Program of the conference. All committee members are asked to help guide the program as well as “beat the bushes” to encourage colleagues, customers, and suppliers to submit their work for an interesting and topical agenda. Committee members may be asked to help select the presentations, invite additional speakers and presenters, provide tutorials, and coordinate the technical sessions during the conference. Participation on the SWTest Committee is a purely voluntary activity and should be considered a personal commitment to the conference and associated activities. Anyone interested in becoming a member of the committee and contributing to the success of the SWTest conference should contact the General Chair.
Jerry Broz, Ph.D.
International Test Solutions, General Chair
Translarity, Technical Program Chair
Conference & Exhibits Management, Inc. (CEM), Finance Chair
Technical Program Committee
John Caldwell, Micron Technology, Program Committee
Patrick Mui, JEM America, Program Committee
Darren James, Rudolph Technologies, Program Committee
Karen Armendariz, Celadon Systems
Gunther Boehm, FeinMetall GmbH (Germany)
Geert Gouwy, Melexis Semiconductor (Belgium)
Michael Huebner, Ph.D., FormFactor
Amy Leong, FormFactor, Inc.
Clark Liu, Powertech Technology, Inc. (Taiwan)
Mark Ojeda, Cypress Semiconductor
Suz Ramsbottom, Texas Instruments, Inc.
Raffaele Vallauri, Technoprobe (Italy)
Joey Wu, Member-At-Large (Taiwan)
Alex Yang, MPI Corporation (Taiwan)
Sang Kyu (SK) Yoo, Samsung Electronics (Korea)