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June 8 - 11, 2014, in San Diego, CA, USA

SW Test Celebrates it's 24th Year !

Semiconductor Wafer Test Workshop is the only IEEE Components, Packaging, Manufacturing Technology (CPMT) Society event that focuses on all the aspects associated with microelectronic wafer and die level testing.  The conference has a mixture of manufacturer and vendor presentations.  It is not a sales show, nor an academic or theoretical conference.  It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas.  There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking.

The two and one half-day event starts Sunday afternoon with registration, a reception, a buffet dinner, and a panel discussion. The conference adjourns on Wednesday at noon, in time to get most participants back to work by Thursday morning.  SWTW has grown to almost 500 attendees with more international visitors each year.

SWTW Announces Keynote Speaker

Ken Hansen
Vice President and Chief Technology Officer
Freescale Semiconductor, Inc.

Ken HansenKen Hansen is Vice President and Chief Technology Officer with Freescale Semiconductor. Prior to becoming CTO, Ken was Vice President and led Freescale’s Chief Development Office where he improved design efficiency and reduced product cost for all Freescale business units. Previously, he held several senior technology and management positions at Freescale and Motorola leading research and development teams. He received the BSEE and MSEE degree from the University of Illinois where he also has been recognized as an ECE Distinguished Alumni, is a Fellow of the IEEE, and holds 11 U.S. patents. Ken is an industry veteran, with 37 years of analog and digital design experience in bipolar, CMOS, and BiCMOS technologies primarily in the area of wireless communications.

William R. Mann Memorial Student Fund

Sponsored by the family and friends of William R. Mann and administered by the IEEE Computer and Components, Packaging, & Manufacturing Technology Societies, the William R. Mann Memorial Student Travel Grant program awards travel grants to undergraduate or graduate students attending an accredited university or college who will attend, present a paper or participate at either the IEEE International Test Conference or the IEEE Semiconductor Wafer Test Workshop (one grant each per year).  Please contact SW Test General Chair for more information.

Key Contacts

General Chair
Jerry Broz, Ph.D.
(303) 885-1744

Technical Program Chair
Rey Rincon
(214) 402-6248


Conference Partners
BiTS IS-Test
Key Dates

Exhibit App
April 18, 2014

Corporate Support App
April 18, 2014

Expo Logos
May 2, 2014

Corporate Support Logos
May 2, 2014

Corporate Support Ads
May 2, 2014

Golf Tournament Groups
May 9, 2014

Hotel Reservations
May 9, 2014

Final Paper Submission
May 23, 2014

Online Adv. Registration
May 16, 2014

Online Late Registration
May 30, 2014

Key Links

SWTW Workshop Online Registration

Corporate Support Online Registration

Exhibitor Online Registration

Hotel Online Reservations

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