The IEEE Semiconductor Wafer Test Workshop is the only IEEE Components, Packaging, Manufacturing Technology (CPMT) Society event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking.
The two and one half-day event starts Sunday afternoon with registration, a reception, a buffet dinner, and a panel discussion. The conference adjourns on Wednesday at noon, in time to get most participants back to work by Thursday morning. SWTW has grown to almost 500 attendees with more international visitors each year.
William R. Mann Memorial Student Fund
Sponsored by the family
and friends of William R. Mann and administered by the IEEE
Computer and Components, Packaging, & Manufacturing Technology
Societies, the William R. Mann Memorial Student Travel
Grant program awards travel grants to undergraduate or
graduate students attending an accredited university or college
who will attend, present a paper or participate at either the
IEEE International Test Conference or the IEEE Semiconductor
Wafer Test Workshop (one grant each per year). Please
contact SW Test General Chair for more information.
