Committee

The SWTest Committee is an international group of experienced probe technologists that volunteer their time and efforts to help develop the Technical Program of the conference. All committee members are asked to help guide the program as well as “beat the bushes” to encourage colleagues, customers, and suppliers to submit their work for an interesting and topical agenda. Committee members may be asked to help select the presentations, invite additional speakers and presenters, provide tutorials, and coordinate the technical sessions during the conference. Participation on the SWTest Committee is a purely voluntary activity and should be considered a personal commitment to the conference and associated activities.  Anyone interested in becoming a member of the committee and contributing to the success of the SWTest conference should contact the General Chair.

SWTest Chairs

SWTest Technical Program Committee

• Davide Appello, Technoprobe (Italy)
• John Caldwell, MJC Electronics Corp. (US)
• Eric Chia-Cheng Chang, PhD, Intel (US)
• Geert Gouwy, imec (Belgium)
• Nobuhiro Kawamata, FormFactor KK (Japan)
• Alistair Laing, Micron Technology (US)
• Karan Maniar, AEM (US)
• Clark Liu, Taiwan MJC Co. (Taiwan)
• Muru Meyyappan, Lattice Semiconductors (US)
• Patrick Mui, JEM America (US)
• Mark Ojeda, Infineon (US)
• Kenny Tang, TSMC (Taiwan)
• Nyi Nyi Thein, SanDisk Corporation (US)
• Raffaele Vallauri, Technoprobe (Italy)
• Joey Wu, Toward Technologies, Inc. (Taiwan)
• Andrew Yick, PhD, Marvell (US)
• Alex Yang, MPI Corporation (Taiwan)
• Matthew Zeman, PhD, FormFactor (US)

SWTest Steering Committee

• Davide Appello, Technoprobe (Italy)
• Karen Armendariz, Celadon Systems (US)
• John Caldwell, MJC Electronics Corp. (US)
• Geert Gouwy, IMEC (Belgium)
• Michael Huebner, PhD, Consultant (Germany)
• Nobuhiro Kawamata, FormFactor KK (Japan)
• BC Kim, Samsung (Korea)
• JY Kim, TSE (Korea)
• Alistair Laing, Micron Technology (US)
• Clark Liu, Taiwan MJC Co. (Taiwan)
• Karan Maniar, AEM (US)
• Muru Meyyappan, Lattice Semiconductors (US)
• Mark Ojeda, Infineon (US)
• Kenny Tang, TSMC (Taiwan)
• Nyi Nyi Thein, SanDisk Corporation (US)
• Raffaele Vallauri, Technoprobe (Italy)
• Joey Wu, Toward Technologies, Inc. (Taiwan)
• Andrew Yick, PhD, Marvell (US)
• Matthew Zeman, PhD, FormFactor (US)

SWTest Emeritus Committee Members

• Amy Leong, Consultant/Advisor
• Grace Liu, PhD, Intel Corporation (US)
• Connie Smith, Texas Instruments (US)