2000 Southwest Test Workshop Program

(View the original proceedings - a "large" Adobe Acrobat file)

About The Workshop

The Test Technology Technical Committee of the IEEE Computer Society sponsors over twenty-five similar workshops in various areas of test technology. This is the only IEEE conference that deals specifically with wafer level testing. The two and one half-day event starts Sunday afternoon with registration, a reception, a buffet dinner, and a panel discussion. The conference adjourned on Wednesday at noon, in time to get most participants back to work by Thursday morning. In the past eight years, it has grown to over 475 attendees with many international visitors.

To Advance Wafer Test Technology
To Serve and Inform the Wafer Test Professional
To Boldly Go Where No Workshop Has Gone Before

Copyright Notice

The presentations included in the SWTW proceedings reflect the authors opinions and are presented without change. Inclusion in the proceedings does not constitute an endorsement by the SouthWest Test Workshop Committee, IEEE Computer Society or the IEEE Test Technology Council.
There is no copyright protection claimed by these proceedings. However, each presentation is the work of the authors and their respective companies. As such, proper acknowledgment should be made to the proper source. Any questions regarding the use of any materials presented should be directed to the authors or their respective companies.

The Committee

Bill Mann, General Program Chair
Rey Rincon, Texas Instruments, Technical Program Chair
Jerry Broz, Texas Instruments, Technical Program Vice-Chair
Mike Bonham, Cerprobe
Scott Williams, Cerprobe
Phil Seitzer, Lucent Technologies
Jeanette Roberts, Intel
Tom Foerster, Conexant
Kathy Kontur, Conexant
Dale Gleason, Agilent Technologies
January Kister, Probe Technology
Todd Schnack, Probe Technology
Fred Taber, IBM Microelectronics

What is a Test Workshop?

Not a theoretical or academic conference
Informal and relaxed atmosphere
Provides practical solutions to real problems
Mixture of vendor and user presentations
Open discussions and networking

Informal Discussions

Long breaks for discussion with “colleagues”
Barefoot Bar cocktail party and social hour
Comedic Jugglers on Monday night
Recreational activities

Sea World visit
SWTW - 2000 Sailing Regatta
Miniature Golf Tournament
San Diego Harbor and Naval Yards Cruise

Presentations

Probe Card Cleaning

Monday - June 12, 8:30 to 10:00am

Area Array and Vertical Probing

Monday - June 12, 10:30am to 12:30pm

Probe Mark Inspection

Monday - June 12, 1:30pm to 3:00pm

Probe Potpourri

Monday - June 12, 3:30 to 5:30pm

Controlling Probe Pad Damage

Tuesday - June 13, 8:00 to 10:00am

Impact of Pad Damage on Assembly

Tuesday - June 13, 10:30am to 12:30pm

Probe Contact Resistance

Tuesday - June 13, 10:30am to 12:30pm

Rey Rincon
Texas Instruments (Dallas)

Multi-Site Probing

Wednesday - June 13, 10:30am to 12:00pm

Prizes, Prizes and More Prizes

Best Presentation
Best Data Presented
“Early Bird” Presentation Submitted
Most “Inspirational” Presentation
“Dead Ass Last” Presentation Submitted
Other “Special Awards”

Test Technology Periodicals

International Test Conference
2000 L Street, N.W., Suite 710
Washington, D.C. 20036
Test Technology Technical Committee
Newsletter
1474 Freeman Drive
Amissville, VA 20106
Journal of Electronic Testing
Kiuwer Academic Publishers
101 Philip Drive
Norwell, MA 02061
Design and Test of Computers
10662 Los Vagneros Circle
Los Alamitos, CA 90720-1314
Evaluation Engineering
Nelson Publishing
2504 N. Tamiami Trail
Nokomis, FL 34275-3428
Solid State Technology
PO Box 3284
Northbrook, IL 60065-9595
Final Test Report
Ikonix Corporation
P.O. Box 1938
Lafayette, CA 94549
IEEE Journals, Transactions, and Letters
Contact your local IEEE Chapter or Technical Library