(Each presentation is in Adobe Acrobat format)


Awarded Presentations

Technical Tutorials

Mr. Rey Rincon (NXP Semiconductor – Austin, TX, USA)

Session #1 - Diverse Probe Challenges

Session #2 - Modeling & Measurement

Session #3 - Memories (HBM, Cu Pillars)

Karen Armendariz (Celadon Systems - USA)

Session #4 - Contact and Performance

Session #5 - Substrates - Space Transformers

Session #6 - CCC & MAC Methods

Joey Wu (MPI Corporation - Taiwan)

Session #7 - Challenges of Probing Ever-Finer Geometries

Session #8 - RF & Radar

Session #9 - Process Improvement

Rey Rincon (NXP Semiconductor - USA)

Poster Session



Steering Committee Members for SW Test 2017:

Dr. Jerry Broz, Ph.D., MJC Electronics, Corp., General Chair
Rey Rincon, NXP Semiconductor, Technical Program Chair
Maddie Harwood, CEM Inc., Finance Chair
John Caldwell, Micron Technology, Program Committee
Patrick Mui, JEM America, Program Committee
Fred Taber, Consultant
Karen Armendariz, Celadon Systems
Gunther Boehm, FeinMetall GmbH
Michael Huebner, Ph.D., FormFactor
Amy Leong, FormFactor, Inc.
Clark Liu, Powertech Technology, Inc. (PTI – Taiwan)
Gary Maier, IBM Corporation
Mark Ojeda, Cypress Semiconductor
Joey Wu, MPI Corporation (Taiwan)
Al Wegleitner, Texas Instruments, Inc.
Sang Kyu (SK) Yoo, Samsung Electronics – Korea
Stevan Hunter, Ph.D., ON Semiconductor, Committee Emeritus
Darren James, Rudolph Technologies, Committee Emeritus

The presentations included in the SWTW proceedings reflect the authors opinions and are presented without change. Inclusion in the proceedings does not constitute an endorsement by the SouthWest Test Workshop Committee.

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