Steering Committee Members for SW Test 2017:
Dr. Jerry Broz, Ph.D., MJC Electronics, Corp., General Chair
Rey Rincon, NXP Semiconductor, Technical Program Chair
Maddie Harwood, CEM Inc., Finance Chair
John Caldwell, Micron Technology, Program Committee
Patrick Mui, JEM America, Program Committee
Fred Taber, Consultant
Karen Armendariz, Celadon Systems
Gunther Boehm, FeinMetall GmbH
Michael Huebner, Ph.D., FormFactor
Amy Leong, FormFactor, Inc.
Clark Liu, Powertech Technology, Inc. (PTI – Taiwan)
Gary Maier, IBM Corporation
Mark Ojeda, Cypress Semiconductor
Joey Wu, MPI Corporation (Taiwan)
Al Wegleitner, Texas Instruments, Inc.
Sang Kyu (SK) Yoo, Samsung Electronics – Korea
Stevan Hunter, Ph.D., ON Semiconductor, Committee Emeritus
Darren James, Rudolph Technologies, Committee Emeritus
The presentations included in the SWTW proceedings reflect the authors opinions and are presented without change. Inclusion in the proceedings does not constitute an endorsement by the SouthWest Test Workshop Committee.
Papers previously copyrighted or with copyright restrictions cannot be presented. In keeping with a workshop environment and to avoid copyright issues, SWTW does not officially seek a copyright ownership / transfer from authors. Authors agree by submitting their work that their presentation is original work and substantially not published previously or copyrighted, may be referenced in the work of others, will be assembled / distributed in the SWTW Proceedings, and made available for download by anyone from the SWTW website.