Steering Committee Members for SW Test 2013:
Dr. Jerry Broz, Ph.D.,
International Test Solutions, General
Freescale Semiconductor, Technical
CEM Inc., Finance
Micron Technology, Program Committee
Rudolph Technologies, Program Committee
NXP Semiconductor, Program Committee
JEM America, Program Committee
BiTS Workshop, Proceedings Coordinator
Micronics Japan (MJC)
FormFactor / Microprobe
Powertech Technology, Inc. (PTI)
The presentations included in the SWTW proceedings reflect the authors opinions and are presented without change. Inclusion in the proceedings does not constitute an endorsement by the SouthWest Test Workshop Committee, IEEE CPMT Society, IEEE Computer Society or the IEEE Test Technology Council.
Papers previously copyrighted or with copyright restrictions cannot be presented. In keeping with a workshop environment and to avoid copyright issues, SWTW does not officially seek a copyright ownership / transfer from authors. Authors agree by submitting their work that their presentation is original work and substantially not published previously or copyrighted, may be referenced in the work of others, will be assembled / distributed in the SWTW Proceedings, and made available for download by anyone from the SWTW website.