(Each presentation is in Adobe Acrobat format) |
| Bill Mann General Chair Southwest Test Workshop 519 Westminster Ave. Newport Beach, CA 92663 949-645-3294 william.mann@ieee.org |
"WLBI at Motorola"
| Teresa McKenzie Motorola Semiconductor Products Sector 6501 William Cannon Dr. West Austin, TX 78435 512.895.4826 t.mckenzie@motorola.com |
"Solutions to Technical Challenges for WLBI"
| Steve Steps Aehr Test Systems 400 Kato Terrace Fremont, CA 94539 510-623-9400 x-257 ssteps@aehr.com |
DINNER GUEST SPEAKERS
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
"Wafer Testing - Where Back End Meets the Front End"
| Charles L. Lassen Managing Partner Prismark Partners, LLC 130 Main Street Cold Springs Harbor, NY 11724 |
"The Need for a Revolution in Test Tooling"
| Steven B. Strauss Intel Test Tooling Operation Manager Intel Corp. 5000 W. Chandler Blvd., M/S CH2-112 Chandler, AZ 85226 480-554-8123 steven.b.strauss@intel.com |
"Cassini Spacecraft Exploration of Saturn"
| Kevin Grazier, Ph.D. Jet Propulsion Labs 4800 Oak Grove Dr., M/S 230-205 Pasadena, CA 91109 krg@anlashok.jpl.nasa.gov |
"International SEMATECH Wafer Probe Benchmarking Project"
| Fred Taber Probe Project Chair IBM Microelectronics ZIP 5E1 2070 Route 52 Hopewell Junction, NY 12533 845-894-2348 taber@us.ibm.com |
OPENING SESSION
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
"Welcome to SWTW-2002"
| Bill Mann General Chair Southwest Test Workshop Newport Beach, CA 92663 949-645-3294 william.mann@ieee.org |
Session 1 - HIGH POWER PROBING
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
Winner - Best Overall Presentation
"Modeling Distributed Power Delivery Effects in High Performance Sort Interface Units"
|
Brett
Grossman Intel Corp. 2501 NW 229th Street, RA2-215 Hillsboro, OR 97124 971-214-5107 Brett.Grossman@intel.com |
Tim Swettlen Intel Corp. 2200 Mission College Blvd Santa Clara, CA 95054 408-653-7846 tim.swettlen@intel.com |
"Enabling at Speed Parallel Testing for High Power Products"
| Tim Swettlen Abdel Abdelrahman Intel Corp. 2200 Mission College Blvd Santa Clara, CA 95054 408-653-7846 tim.swettlen@intel.com abdel.abdelrahman@intel.com |
Winner - Most Inspirational
Presentation
"Probing
10 kV and 100 Amps: Challenges and Solutions for High Voltage
/ High Current Wafer Probing"
| Rainer Gaggl, Ph.D. T.I.P.S. Messtechnik GmbH Getreideweg 1, A-9500 Villach +43 4242 319720 r.gaggl@tips.co.at |
Session 2 - PROCESS OPTIMIZATION
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
"How to Reach more than 1 Million Touchdowns per Probe Head when Testing High Current / High Pin Count Microprocessors ???"
| Jens Kober AMD Saxony Manufacturing GmbH Mail Stop E23-TE Wilschdorfer Landstr. 101 D-01109 Dresden, Germany (+49) 351 - 277 44 13 Jens.Kober@amd.com |
"Best Practice Metrology Protocol"
| Sal Gullotta Wentworth Laboratories, Inc. 101 Commerce Drive Brookfield, CT 06804 203-775-9311 x 1137 sgullotta@wentworthlabs.com |
W. Stuart Crippen Intel Corp. 5000 W. Chandler Blvd. Chandler AZ 85224 480-554-8961 warren.crippen@intel.com |
"Extending Probe Card Life for Fine Pitch Probe Cards"
| Gene
Humphrey International Test Solutions 2479 Chardonnay Way Livermore, CA 94550 925-606-9828 geneh@inttest.net |
Session 3 - ADVANCES IN PROBE CARD ANALYZERS
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
"Probe Card Metrology and Correlation at High Temperature"
| Rod Schwartz Daniel Kosecki Integrated Technology Corporation 1228 N. Stadem Drive Tempe, Arizona 85281 USA 480-968-3459 rod@inttechcorp.com dank@inttechcorp.com |
"Application of Precision Engineering Principles in Linear Stage Design"
| Gary Gunderson Applied Precision, LLC 1040 12th Avenue NW Issaquah, WA 98027 425-557-1000 ggunder@api.com |
"A Novel, High Precision Approach for Probe Card Metrology"
| Raymond Kraft, Ph.D. Applied Precision, LLC 1040 12th Avenue NW Issaquah, WA 98027 425-557-1000 rkraft@api.com |
Session 4 - PROBE POTPOURRI
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
"Dynamic Variation of Contact Resistance in Test Interfaces"
| Todd Sargent Testdesign / inTest Corporation 1124 Davis St. Redwood City, CA 94061 650-369-5928 wavebox@pacbell.net t.sargent@intest.com |
"Advances in Laser Micromachining for Wafer Probing and Trimming"
| Andrew Webb Oxford Lasers, Inc. 29 King Street Littleton, MA 01460-1528 800-222-3632 x106 awebb@oxfordlasers.com |
"Using MLO Packages to Build Vertical Probe Space Transformers"
| Bill Pardee Bill Fulton Wentworth Laboratories, Inc. 101 Commerce Drive Brookfield, CT 06804 203-775-9311 x1189 / x1105 bfulton@wentworthlabs.com bpardee@wentworthlabs.com |
Session 5 - C4 BUMP CHALLENGES
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
"Electrical and Mechanical Characterization of MicroSpring BladeRunner tips on Reflowed Eutectic Bumps"
| Rod Martens, Ph.D. Form Factor, Inc. 2140 Research Drive Livermore, CA 94550 925-456-3813 rmartens@formfactor.com |
Scott Mitchell Texas Instruments, Inc. 13560 North Central Expressway, MS 3738 Dallas TX, 75265 972-995-5055 s-mitchell1@ti.com |
Winner - Best Data Presentation
"Probing Lead Free Solder Bumps in Final Wafer Test"
| Sam McKnight IBM Microelectronics ZIP 5E1 2070 Route 52 Hopewell Junction, NY 12533 mcknighs@us.ibm.com |
"Intel Sort-Interface-Unit (SIU) Design Methods for Reducing Burn Rates on Tight-Pitch C4 Logic Arrays"
| Kip Stevenson Pooya Tadayon Intel Corp. Sort Test Technology Development 2501 N.W. 229th Street , RA1-331 Hillsboro, OR 97124 Kip.P.Stevenson@intel.com Pooya.Tadayon@intel.com |
Session 6 - RF and PARAMETRIC PROBING
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
"40 GHz on Wafer Testing for Two Port Devices"
|
Mark
Echeagaray MaCom Tech 5300 Hellyer San Jose, CA 408-624-3087 markech@california.com |
Winner - Best Presentation, Tutorial in Nature
"RF S-Parameter
Measurements - A Production Solution"
| William Knauer Keithley Instruments, Inc. Cleveland, OH knauer_bill@keithley.com |
"Production Test of Process Control Monitors (PCMs) with Pyramid Probe Cards"
|
Ken
Smith Cascade MicroTech Portland, OR 503-601-1955 Ken_Smith@cmicro.com |
William
Knauer Keithley Instruments, Inc. Cleveland, OH knauer_bill@keithley.com |
Jerry
Broz, Ph.D. Jason Aronoff Texas Instruments, Inc. 13560 North Central Expressway Dallas TX, 75265 j-aronoff@ti.com |
"Ultra Low Noise Probing for Parametric and RF Testing"
| Larry Hendler Hendler Enterprises 10330 Colby Ave. Cupertino, CA 95014 408-528-3280 lhendler@electroglas.com |
John Salois Steve Lugosi Karl Heiman Robert Fenton Electroglas 6024 Silver Valley Creek Rd San Jose, CA 95138 408-528-3879 jsalois@electroglas.com slugosi@electroglas.com kheiman@electroglas.com rfenton@electroglas.com |
Session 7 - WHAT'S NEXT FOR PROBERS?
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
"Advanced Fiducial Alignment for Photolithography Probe Cards"
| Troy Harnisch Ira Feldman NanoNexus Inc. 400 Kato Terrace Fremont, CA 94539 510 623-9911 tharnisch@nanonexus.com ifeldman@nanonexus.com |
Karl Heiman Fenglei Du Electroglas Inc. 6024 Silver Creek Valley Rd San Jose, CA 95138-1011 408 528-3884 krheiman@electroglas.com FDu@electroglas.com |
"Speed Bumps in Fast Probing"
| Lalit Kumar, Ph.D. Janaki Vegiraju Bob Fenton Electroglas, Inc. 6024 Silver Creek Valley Rd San Jose, CA 95138 408-528-3432 Lkumar@Electroglas.com Jvegiraju@Electroglas.com bfenton@electroglas.com |
"GlasTest : Interface Management Software for EG2001"
| Philippe Sandri Brice Blanc PHS MEMS Av de Rochepleine , BP 420 F38524 Saint Egreve cedex 33 (0) 476 58 4955 p.sandri@phsmems.com b.blanc@phsmems.com |
Session 8 - NEW PROBE TECHNOLOGIES
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
"HAWK: High Parallel Hybrid Probe Card for Memory Devices"
|
Phill
Mai JEM America Corp. 3000 Laurelview Court Fremont, CA 94538 510-683-9234 ext 114 pmai@jemrd.com |
"Area Array Cobra Probe Card With 5 GHz. Bandwidth"
|
Raphael
Robertazzi IBM T.J. Watson Research Center Building 801 Rt 134 MS 13-257 Yorktown Heights, NY 10598 914-945-3620 tazzi@us.ibm.com |
"Advantest's PhotoFinger™ Probecard"
| David Yu, Ph.D. Yu Zhou, Ph.D. Advantest America, Inc. Buffalo Grove, IL 847-821-3204 d.yu@advantest.com y.zhou@advantest.com |
"VSCC: Vertical Spring Contact Card for Bump Probing"
| Patrick Mui Kaz Okubo JEM America Corp. 3000 Laurelview Court Fremont, CA 94538 510-683-9234 ext 114 pmui@jemam.com |
Shunsuke Sasaki Akira Okuma NHK International |
Session 9 - PROBE PROCESS ASSESSMENT
Top | Session 1 | Session 2 | Session 3 | Session 4 | Session 5 | Session 6 | Session 7 | Session 8 | Session 9
"High Productivity/Cost Effective Wafer Probing"
| Larry Hendler Hendler Enterprises 10330 Colby Ave. Cupertino, CA 95014 408-528-3280 lhendler@electroglas.com |
Karl Heiman Robert Fenton Electroglas 6024 Silver Valley Creek Rd San Jose, CA 95138 408-528-3879 kheiman@electroglas.com rfenton@electroglas.com |
"Towards the Fine Pitch - Constraints and Methodology"
| Geraldine Persico David Papazian Roger Milesi ST Microelectronics 850, rue Jean Monnet CROLLES Cedex +33 (4) 76925431 Geraldine.persico@st.com David.papazian@st.com Roger.milesi@st.com |
SWTW 2002 Program Committee Members:
Bill Mann, General Chair, william.mann@ieee.org
Rey Rincon, Texas Instruments, Technical Program Chair, r-rincon@ti.com
Jerry Broz, Technical Program Vice-Chair, jerry.broz@swtest.org
Fred Taber, IBM, taber@ibm.com