Emmett RICKS (Micron - USA)
Hsu Hao CHANG, Amit AGNIHOTRI, Andrew YICK, Dongwon LEE (Marvell - USA), Giulia ROTTOLI (Technoprobe - Italy)
Edgar HEPP, Wabe KOELMANS, Francesco COLANGELO, Patrik SCHüRCH (Exaddon - Switzerland), Francois GIX, Sebastien SCHOENE (Synergie CAD - France)
Oscar LEE, Harvey LIN (Taiwan Semiconductor Manufacturing Co., Ltd. – Taiwan)
Philipp DIETRICH, Andres MACHADO, Florian RUPP, Roman ZVAHELSKYI (Keystone Photonics GmbH - Germany)
Takaharu OHYAMA, Shigeki OKA, Tomohisa HOSHINO, Yasushi WATANABE (YOKOWO CO., LTD. – Japan)
Raffaele Vallauri
VP Director, Technoprobe SpA - Italy
Jerry Broz, PhD
SWTest General Chair, SWTest Conference, USA
Raffaele Vallauri
VP Director, Technoprobe SpA - Italy
Session Chair: Mark Ojeda (Infineon Semiconductor, USA)
Scott JORDAN (PI - USA)
Philipp DIETRICH, Andres MACHADO, Florian RUPP, Roman ZVAHELSKYI (Keystone Photonics GmbH - Germany)
Matthew PRICE, Nikta JALAYER (Physik instrumente - USA)
Hsu Hao CHANG, Amit AGNIHOTRI, Andrew YICK, Dongwon LEE (Marvell - USA), Giulia ROTTOLI (Technoprobe - Italy)
Session Chair: Geert Gouwy (imec - Belgium)
Edgar HEPP, Wabe KOELMANS, Francesco COLANGELO, Patrik SCHüRCH (Exaddon - Switzerland), Francois GIX, Sebastien SCHOENE (Synergie CAD - France)
Victoria TRAN (Gel-Pak - USA), Garrett TRANQUILLO (Celadon Systems, Inc. - USA)
Apoorva DUBE (FormFactor – USA), Judd GERBER, Sanjay BIDASARIA, Philip TAVERNIER (Intel – USA), Mukesh SELVARAJ (FormFactor – USA)
Session Chair: Muru Meyyappan (enfabrica - USA)
Dalton ROEHL, Garrett TRANQUILLO, Karen ARMENDARIZ (Celadon Systems - USA), Gregory NIELSON, Brad FERGUSON, Jared PAYNE, Rebecca ANDERSON (Nielson Scientific LLC - USA), Alexander HORSPOOL, Dillon JENSEN, Noah JOHNSON, Stephen SCHULTZ (Brigham Young University - USA)
Luca FANELLI (SPEA S.p.A. – Italy), Raimondo P. SESSEGO (NXP – USA)
Pardeep KUMAR, Zehao LI, Kwame AMPONSAH (Xallent Inc. – USA), Theodore LEVIN, Arthur GASASIRA (IBM – USA)
Karen Armendariz
Celadon Systems, USA
Session Chair: Karen Armendariz (Celadon Systems - USA)
Leon BESPROZVANNY, Cameron HARKER, Robert WHITE (FormFactor – USA)
Oscar LEE, Harvey LIN (Taiwan Semiconductor Manufacturing Co., Ltd. – Taiwan)
Session Chair: Karan Maniar (AEM - USA)
Muhammad Hameem RAHMAN, Quaid Joher FURNITUREWALA (Advantest America Inc. – USA)
Daniel BOCK (FormFactor - USA)
Don THOMPSON (PTSL - USA)
Emmett RICKS (Micron - USA)
Session Chair: Davide Appello (Technoprobe SpA, Italy)
Pratik GHATE (FormFactor, Inc. - USA)
Ksenija VARGA, Alois MALZER, Thomas UHRMANN, Peter URBAN, Christoph WOLF, Tobias ZENGER (EV Group - Austria)
Chris STOKES (Oxford Lasers Ltd - United Kingdom)
Session Chair: Patrick Mui (JEM America, USA)
Martin KUNZ (Solarius GmbH - Germany), Franz STEGER (Texas Instruments Deutschland GmbH - Germany)
Luigi MILAZZO, Antonio RINALDI, Federico MARIANI, Federico TRESOLDI (Technoprobe - Italy), Alfredo BENSO (Politecnico di Torino - Italy)
Patrick SULLIVAN (ElevATE Semiconductor – USA), Dan HICKS (STAr-Edge Technologies – USA), Matthew GETZ, Sandeep D’SOUZA, Tim BAKKEN (ElevATE Semiconductor – USA)
Session Chair: Jerry Broz (SWTest Conference, USA)
Brent BULLOCK (Advantest America Inc. - USA)
Diana DAMIAN, Georg FRANZ (T.I.P.S. Messtechnik GmbH - Austria)
Rainer GAGGL, Sebastian SALBRECHTER (T.I.P.S. Messtechnik GmbH - Austria), Davide GRISAFI, Sebastiano GRIMALDI (ST Microelectronics, Catania - Italy)
Klaudiusz HOLECZEK (Watttron GmbH - Germany), Klemens REITINGER (ERS electronic GmbH - Germany)
Session Chair: John Caldwell (MJC Electronics Corporation – USA)
Patrick BOWEN, Grant JUSTICE (Deringer-Ney Inc - USA)
Thilo HAPP (Sickert&Hafner Automotive Gmbh – Germany)
Wai Kit K (Lincstech Co., Ltd. - Japan)
Alan LIAO (FormFactor - USA), Hiromitsu TAKASU (ADVANTEST - Japan)
Takaharu OHYAMA, Shigeki OKA, Tomohisa HOSHINO, Yasushi WATANABE (YOKOWO CO., LTD. – Japan)
Dan RISHAVY, Quan YUAN (FormFactor, Inc. – USA)
* PDF not provided
Kenny SONG, River HUANG (Probing Semiconductor Technology Shanghai Co.,Ltd – China)
Matthias WEGNER, Jochen SCHUSTER, Nail AKROUTI (Heraeus Precious Metals - Germany)
Benedikt PONGRATZ (Turbodynamics - USA)